E 3 CC: A memory error protection scheme with novel address mapping for subranked and low-power memories

Author:

Chen Long1,Cao Yanan1,Zhang Zhao1

Affiliation:

1. Iowa State University

Abstract

This study presents and evaluates E 3 CC (Enhanced Embedded ECC), a full design and implementation of a generic embedded ECC scheme that enables power-efficient error protection for subranked memory systems. It incorporates a novel address mapping scheme called Biased Chinese Remainder Mapping (BCRM) to resolve the address mapping issue for memories of page interleaving, plus a simple and effective cache design to reduce extra ECC traffic. Our evaluation using SPEC CPU2006 benchmarks confirms the performance and power efficiency of the E 3 CC scheme for subranked memories as well as conventional memories.

Publisher

Association for Computing Machinery (ACM)

Subject

Hardware and Architecture,Information Systems,Software

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A survey of techniques for improving error-resilience of DRAM;Journal of Systems Architecture;2018-11

2. Odd-ECC;Proceedings of the International Symposium on Memory Systems;2017-10-02

3. Measuring the Impact of Memory Errors on Application  Performance;IEEE Computer Architecture Letters;2017-01-01

4. Three-Dimensional Dynamic Random Access Memories Using Through-Silicon-Vias;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2016-09

5. MIMS: Towards a Message Interface Based Memory System;Journal of Computer Science and Technology;2014-03

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