Abstract
This study presents and evaluates E
3
CC (Enhanced Embedded ECC), a full design and implementation of a generic embedded ECC scheme that enables power-efficient error protection for subranked memory systems. It incorporates a novel address mapping scheme called Biased Chinese Remainder Mapping (BCRM) to resolve the address mapping issue for memories of page interleaving, plus a simple and effective cache design to reduce extra ECC traffic. Our evaluation using SPEC CPU2006 benchmarks confirms the performance and power efficiency of the E
3
CC scheme for subranked memories as well as conventional memories.
Publisher
Association for Computing Machinery (ACM)
Subject
Hardware and Architecture,Information Systems,Software
Cited by
5 articles.
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1. A survey of techniques for improving error-resilience of DRAM;Journal of Systems Architecture;2018-11
2. Odd-ECC;Proceedings of the International Symposium on Memory Systems;2017-10-02
3. Measuring the Impact of Memory Errors on Application Performance;IEEE Computer Architecture Letters;2017-01-01
4. Three-Dimensional Dynamic Random Access Memories Using Through-Silicon-Vias;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2016-09
5. MIMS: Towards a Message Interface Based Memory System;Journal of Computer Science and Technology;2014-03