A survey of techniques for improving error-resilience of DRAM-Reference-Cited by-同舟云学术

A survey of techniques for improving error-resilience of DRAM

Published:2018-11 Issue: Volume:91 Page:11-40
ISSN:1383-7621
Container-title:Journal of Systems Architecture
language:en
Short-container-title:Journal of Systems Architecture

Author:

Mittal Sparsh^ORCID,Inukonda Maruthi S.

Publisher

Elsevier BV

Subject

Hardware and Architecture,Software

Reference87 articles.

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4. Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices;Cha,2017

5. A survey of techniques for modeling and improving reliability of computing systems;Mittal;IEEE Trans. Parallel Distrib. Syst.,2015

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