Orinoco: Ordered Issue and Unordered Commit with Non-Collapsible Queues

Author:

Chen Dibei1ORCID,Zhang Tairan1ORCID,Huang Yi1ORCID,Zhu Jianfeng1ORCID,Liu Yang2ORCID,Gou Pengfei2ORCID,Feng Chunyang3ORCID,Li Binghua3ORCID,Wei Shaojun1ORCID,Liu Leibo1ORCID

Affiliation:

1. Tsinghua University, Beijing, China

2. Innovation Institute of High Performance Server, Guangzhou, China

3. HEXIN Technologies, Guangzhou, China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Publisher

ACM

Reference79 articles.

1. Jaume Abella Ferrer , Ramon Canal Corretger, and Antonio María González Colás . 2003 . Power-and complexity-aware issue queue designs. IEEE micro 23, 5 (2003), 50--58. Jaume Abella Ferrer, Ramon Canal Corretger, and Antonio María González Colás. 2003. Power-and complexity-aware issue queue designs. IEEE micro 23, 5 (2003), 50--58.

2. X-SRAM: Enabling In-Memory Boolean Computations in CMOS Static Random Access Memories

3. Exploring the Performance Limits of Out-of-order Commit

4. Mehdi Alipour , Stefanos Kaxiras , David Black-Schaffer , and Rakesh Kumar . 2020 . Delay and bypass: Ready and criticality aware instruction scheduling in out-of-order processors . In 2020 IEEE International Symposium on High Performance Computer Architecture (HPCA). IEEE, 424--434 . Mehdi Alipour, Stefanos Kaxiras, David Black-Schaffer, and Rakesh Kumar. 2020. Delay and bypass: Ready and criticality aware instruction scheduling in out-of-order processors. In 2020 IEEE International Symposium on High Performance Computer Architecture (HPCA). IEEE, 424--434.

5. Mehdi Alipour , Rakesh Kumar , Stefanos Kaxiras , and David Black-Schaffer . 2019 . FIFOrder MicroArchitecture: Ready-aware instruction scheduling for OoO processors. In 2019 Design , Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 716--721 . Mehdi Alipour, Rakesh Kumar, Stefanos Kaxiras, and David Black-Schaffer. 2019. FIFOrder MicroArchitecture: Ready-aware instruction scheduling for OoO processors. In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 716--721.

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