An Improved PCB Defect Detector Based on Feature Pyramid Networks
Author:
Affiliation:
1. Hunan Normal University, China
2. Hunan Normal University
3. National University of Defense Technology
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3445815.3445853
Reference20 articles.
1. Defect Classification of Electronic Circuit Board Using SVM based on Random Sampling
2. Peng W. Chang L. Mengyuan L. Yunlong G. & Hong L. . CNN-based reference comparison method for classifying bare PCB defects. 2018(16) 1528-1533. Peng W. Chang L. Mengyuan L. Yunlong G. & Hong L. . CNN-based reference comparison method for classifying bare PCB defects. 2018(16) 1528-1533.
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