CNN‐based reference comparison method for classifying bare PCB defects-Reference-Cited by-同舟云学术

CNN‐based reference comparison method for classifying bare PCB defects

Published:2018-10-29 Issue:16 Volume:2018 Page:1528-1533
ISSN:2051-3305
Container-title:The Journal of Engineering
language:en
Short-container-title:J. eng.

Author:

Wei Peng¹,Liu Chang²,Liu Mengyuan³,Gao Yunlong¹,Liu Hong²

Affiliation:

1. Department of AutomationXiamen UniversityXiamenPeople's Republic of China

2. Key Laboratory of Machine PerceptionShenzhen Graduate SchoolPeking UniversityShenzhenPeople's Republic of China

3. Nanyang Technological UniversitySingaporeSingapore

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering,Energy Engineering and Power Technology,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2018.8271

Reference22 articles.

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4. Automated inspection of printed circuit boards through machine vision;Wu W.‐Y.;Comput. Ind.,1996

5. IbrahimZ. Al‐AttasS.A.R. AsparZ.et al.: ‘Performance evaluation of wavelet‐based PCB defect detection and localization algorithm’.2002 IEEE Int. Conf. Industrial Technology (IEEE ICIT '02) Bangkok Thailand December 2002 vol. 1 pp.226–231

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