Author:
Srivastava Amitabh,Eustace Alan
Cited by
195 articles.
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1. Towards Realistic Results for Instrumentation-Based Profilers for JIT-Compiled Systems;Proceedings of the 21st ACM SIGPLAN International Conference on Managed Programming Languages and Runtimes;2024-09-13
2. Electronic Properties of Si and C Substitutional Defects and Porosity in C‐Rich and Si‐Rich Hydrogenated Roundish SiC Quantum Dots: An Ab‐Initio Study;Advanced Theory and Simulations;2024-08-17
3. Flexible Non-intrusive Dynamic Instrumentation for WebAssembly;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 3;2024-04-27
4. Don’t Trust Your Profiler: An Empirical Study on the Precision and Accuracy of Java Profilers;Proceedings of the 20th ACM SIGPLAN International Conference on Managed Programming Languages and Runtimes;2023-10-19
5. QueryX: Symbolic Query on Decompiled Code for Finding Bugs in COTS Binaries;2023 IEEE Symposium on Security and Privacy (SP);2023-05