Electronic Properties of Si and C Substitutional Defects and Porosity in C‐Rich and Si‐Rich Hydrogenated Roundish SiC Quantum Dots: An Ab‐Initio Study

Author:

Cuevas Figueroa José Luis1ORCID,Thirumuruganandham Saravana Prakash2ORCID,Mowbray Duncan John3ORCID,Trejo Baños Alejandro4ORCID,Serrano Orozco Fernando Adán4,Jimenez Fabian5ORCID,Ojeda‐Martínez Miguel6ORCID

Affiliation:

1. Secretaría Academica Universidad Tecnológica Emiliano Zapata del Estado de Morelos Av. Universidad Tecnológica No. 1 Col. Palo Escrito Morelos 62765 Mexico

2. Siddha Vetha Multiversity 211 Warren street Newark 07103 USA

3. Yachay Tech University School of Physical Sciences and Nanotechnology Urcuquí 100119 Ecuador

4. Instituto Politécnico Nacional ESIME‐Culhuacán Av. Santa Ana 1000 Ciudad de México 04430 Mexico

5. Technology Department NFinnovations LLC 600 SW 5th Ct #j405 Renton WA 98057 USA

6. Universidad de Guadalajara, Centro de Investigación en Nanociencias y Nanotecnología de CUValles Depto. de Ciencias Naturales y Exactas Ameca Jalisco 46600 México

Abstract

AbstractIn this study, SiC quantum dots (SiC‐QD's) are studied, and some roundish SiC‐QD's with the incorporation of defects by removing a carbon or silicon atom are considered. Fourteen configurations are modeled in which the position of the silicon or carbon defect for each configuration is changed, considering that due to the chemical composition, it allows more Si atoms or more C atoms on the QD surface. All calculations are performed using the Density Functional Theory (DFT) methodology. The electronic exchange correlation is treated using the Generalized Gradient Approximation (GGA) with the Revised Perdew–Burke–Ernzerhof (RPBE) functional. The electronic energy levels of each configuration are calculated as well as the partial density of states to know the origin of the energy gap in each quantum dot. The final step is to analyze the energy formation to determine chemical stability.

Publisher

Wiley

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