Laser Profiling for the Back-Side Fault Attacks
Author:
Affiliation:
1. Nanyang Technological University, Singapore, Singapore
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2732198.2732206
Reference10 articles.
1. E. Biham and A. Shamir " Differential fault analysis of secret key cryptosystems " in Advances in Cryptology - CRYPTO '97 (J. Kaliski Burton S. ed.) vol. 1294 of Lecture Notes in Computer Science pp. 513 -- 525 Springer Berlin Heidelberg 1997 . E. Biham and A. Shamir "Differential fault analysis of secret key cryptosystems " in Advances in Cryptology - CRYPTO '97 (J. Kaliski Burton S. ed.) vol. 1294 of Lecture Notes in Computer Science pp. 513--525 Springer Berlin Heidelberg 1997.
2. Optical properties of intrinsic silicon at 300 K
3. S. Skorobogatov and R. Anderson " Optical Fault Induction Attacks " in Cryptographic Hardware and Embedded Systems - CHES 2002 (B. Kaliski ç . Koç and C. Paar eds.) vol. 2523 of Lecture Notes in Computer Science pp. 2 -- 12 Springer Berlin Heidelberg 2003 . S. Skorobogatov and R. Anderson "Optical Fault Induction Attacks " in Cryptographic Hardware and Embedded Systems - CHES 2002 (B. Kaliski ç. Koç and C. Paar eds.) vol. 2523 of Lecture Notes in Computer Science pp. 2--12 Springer Berlin Heidelberg 2003.
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