Effective Layout Design for Laser Fault Sensor on FPGA
Author:
Affiliation:
1. National Institute of Advanced Industrial Science and Technology & Yokohama National University, Koto-ku, Yokohama, Japan
2. Yokohama National University, Yokohama, Japan
Funder
New Energy and Industrial Technology Development Organization
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3605769.3623995
Reference20 articles.
1. Differential fault analysis of secret key cryptosystems
2. Laser Profiling for the Back-Side Fault Attacks
3. Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller
4. Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot
5. Shoei Nashimoto , Daisuke Suzuki , Rei Ueno , and Naofumi Homma . Bypassing isolated execution on risc-v using side-channel-assisted fault-injection and its countermeasure . IACR Transactions on Cryptographic Hardware and Embedded Systems , pages 28 -- 68 , 2022 . Shoei Nashimoto, Daisuke Suzuki, Rei Ueno, and Naofumi Homma. Bypassing isolated execution on risc-v using side-channel-assisted fault-injection and its countermeasure. IACR Transactions on Cryptographic Hardware and Embedded Systems, pages 28--68, 2022.
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