Dynamic thermal management for FinFET-based circuits exploiting the temperature effect inversion phenomenon

Author:

Lee Woojoo1,Wang Yanzhi1,Cui Tiansong1,Nazarian Shahin1,Pedram Massoud1

Affiliation:

1. University of Southern California, Los Angeles, CA, USA

Funder

Semiconductor Research Corporation

Defense Advanced Research Projects Agency

Publisher

ACM

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