Author:
,Ilyinykh A.S.,Lysenkova A.A.,
Abstract
The current need for non-destructive grain analysis in the soybean industry is largely met by a widely practiced and established analytical method of infrared spectroscopy, which provides rapid and easy grain analysis. Raman spectroscopy is being considered as a promising alternative non-destructive method. The profiles of IR spectra and Raman spectra have been obtained, and the prospects for using the indicated methods for identifying soybeans by variety have been analyzed.
Publisher
PANORAMA Publishing House