Study of the resistive switching and electrode degradation in Al/TiO2/FTO thin films upon thermal treatment in reducing atmosphere
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Published:2021-12-31
Issue:6
Volume:12
Page:783-791
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ISSN:2220-8054
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Container-title:Nanosystems: Physics, Chemistry, Mathematics
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language:
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Short-container-title:Nanosystems: Phys. Chem. Math.
Author:
Illarionov G.A.,Kolchanov D.S.,Chrishtop V.V.,Kasatkin I.A.,Vinogradov A.V.,Morozov M.I.
Publisher
ITMO University
Subject
Physics and Astronomy (miscellaneous),Condensed Matter Physics,Materials Science (miscellaneous),Mathematics (miscellaneous)