Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface-Reference-Cited by-同舟云学术

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Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface

Published:1999-11-01 Issue:3 Volume:48 Page:276-279
ISSN:0295-5075
Container-title:Europhysics Letters (EPL)
language:
Short-container-title:Europhys. Lett.

Author:

Allers W,Schwarz A,Schwarz U. D,Wiesendanger R

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1209/epl/i1999-00477-3/pdf

Cited by 54 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Perspectives on ultra-high vacuum transmission electron microscopy of dynamic crystal growth phenomena;Progress in Materials Science;2023-10

2. Chemical identification with non-contact atomic force microscopy of xenon atoms adsorbed on graphene on Pt(111) surfaces;Applied Surface Science;2021-03

3. Xenon on Graphene/Pt(111) at Low Temperature: Influence of the Metal Support;The Journal of Physical Chemistry C;2020-10-27

4. Low-Temperature Scanning Probe Microscopy;Springer Handbook of Nanotechnology;2017

5. Imaging van der Waals Interactions;The Journal of Physical Chemistry Letters;2016-12-05

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