Chemical identification with non-contact atomic force microscopy of xenon atoms adsorbed on graphene on Pt(111) surfaces-Reference-Cited by-同舟云学术

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Chemical identification with non-contact atomic force microscopy of xenon atoms adsorbed on graphene on Pt(111) surfaces

Published:2021-03 Issue: Volume:542 Page:148669
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Jiménez-Sánchez Mariano D.,Nicoara Nicoleta,Gómez-Rodríguez José M.

Funder

Ministerio de Ciencia e Innovación

Ministerio de Economía y Competitividad

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference46 articles.

1. The chemical structure of a molecule resolved by atomic force microscopy;Gross;Science,2009

2. Recent advances in submolecular resolution with scanning probe microscopy;Gross;Nat. Chem.,2011

3. Nitrous oxide as an effective AFM tip functionalization: a comparative study;Chutora;Beilstein J. Nanotechnol.,2019

4. Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules;Mohn;Appl. Phys. Lett.,2013

5. Van der Waals interactions and the limits of isolated atom models at interfaces;Kawai;Nat. Commun.,2016

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A state of review for graphene-based materials in preparation methods, characterization, and properties;Materials Science and Engineering: B;2024-12

2. Graphene grown on transition metal substrates: Versatile templates for organic molecules with new properties and structures;Surface Science Reports;2022-11

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