Chemical Identification by Force Curves, and Force Mapping
Author:
Affiliation:
1. Graduate School of Engineering, Osaka University
2. Graduate School of Engineering, Kyoto University
3. PRESTO, JST
Publisher
Surface Science Society Japan
Subject
General Earth and Planetary Sciences,General Engineering,General Environmental Science
Link
http://www.jstage.jst.go.jp/article/jsssj/29/4/29_4_214/_pdf
Reference19 articles.
1. Positioning single atoms with a scanning tunnelling microscope
2. Surface Modification by an STM.
3. 3) 森田清三;“走査型プローブ顕微鏡のすべて—原子や分子を見て動かす—” (工業調査会,1992).
4. 4) S. Morita, R. Wiesendanger and E. Meyer (eds.): “Noncontact Atomic Force Microscopy” (NanoScience and Technology Series, Springer-Verlag, Berlin, Heidelberg, New York, 2002).
5. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
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