Interface Induced STM Image at Ultrathin Ag(111) Films on Si(111)√3×√3-B Substrates-Reference-Cited by-同舟云学术

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Interface Induced STM Image at Ultrathin Ag(111) Films on Si(111)√3×√3-B Substrates

Published:2018-10-10 Issue:10 Volume:61 Page:657-662
ISSN:2433-5835
Container-title:Vacuum and Surface Science
language:en
Short-container-title:Vac. Surf. Sci.

Author:

FUKUMOTO Hiroyuki¹,YOSHIIKE Yusaku¹,TAJIRI Hiroo²,YAMAZAKI Shirou³,NAKATSUJI Kan⁴,HIRAYAMA Hiroyuki³

Affiliation:

1. Interdisciplinary School of Science and Engineering, Tokyo Institute of Technology

2. Research and Utilization Division, Japan Synchrotron Radiation Research Institute

3. Department of Physics, Tokyo Institute of Technology

4. Department of Materials Science and Engineering, Tokyo Institute of Technology

Publisher

Surface Science Society Japan

Link

https://www.jstage.jst.go.jp/article/vss/61/10/61_20180210/_pdf

Reference29 articles.

1. 1) D.R. Heslinga, H.H. Weitering, D.P. vand der Werf, T.M. Klapwijk and T. Hibma : Phys. Rev. Lett. 64, 1589 (1990).

2. 2) R.F. Schmitsdorf, T.U. Kampen and W. Mönch : Surf. Sci. 324, 249 (1995).

3. 3) W. Long, Y. Li and R. Tung : Surf. Sci. 610, 48 (2013).

4. 4) W. Mönch : J. Vac. Sci. Technol., B 17, 1867 (1999).

5. 5) H. Hirayama, T. Yamaguchi, H. Ikezawa and K. Tanaka : Phys. Rev. B 66, 073301 (2002).

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