Inference of Ga-primary Ion TOF-SIMS Fragment Pattern of Nitrates and Sulfates.-Reference-Cited by-同舟云学术

Inference of Ga-primary Ion TOF-SIMS Fragment Pattern of Nitrates and Sulfates.

Published:2002 Issue:4 Volume:23 Page:209-214
ISSN:0388-5321
Container-title:Hyomen Kagaku
language:en
Short-container-title:Journal of The Surface Science Society of Japan

Author:

LI Zhanpin¹,HOSHI Takahiro¹,HIROKAWA Kichinosuke¹

Affiliation:

1. ULVAC-PHI, Inc.

Publisher

Surface Science Society Japan

Subject

General Earth and Planetary Sciences,General Engineering,General Environmental Science

Link

http://www.jstage.jst.go.jp/article/jsssj/23/4/23_4_209/_pdf

Reference9 articles.

1. Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxides.

2. 2) K. Hirokawa, Z. Li and A. Tanaka: Fresenius J. Anal. Chem. 370, 348 (2001).

3. On the problem of water adsorption on alkali halide cleavage planes, investigated by secondary ion mass spectroscopy

4. 4) V.C. Vickerman, D. Briggs, A. Henderson: “The Static SIMS Library”, Part 1, Part 2 (Surf. Spectra Ltd., Manchester, UK, 1998).

5. 5) S. Dalio, B. Fachin, S. Gelosi, C. Pagura, A.D.F. Battisti and L. Nanni: “Secondary Ion Mass Spectrometry-SIMS XI” (John Wiley & Sons, Chichester, 1997) p. 647.

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1. Regularity of fragment pattern appearance in the Ga+ primary ion ToF-SIMS;BUNSEKI KAGAKU;2004

2. Consideration of Isotope Abundance in the Inference of Ga+Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds.;Hyomen Kagaku;2002

3. Regularity of Ga+ Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds.;Hyomen Kagaku;2002