1. [1] M. K. Miller, Atom Probe Tomography analysis at atomic level, (Kluwer Academic/Plenum Publishers, New York, 2000).
2. Field ion image formation
3. Pulsed‐laser atom‐probe field‐ion microscopy
4. [4] B. Gault, F. Vurpilot, A. Bostel, A. Menand, and B. Deconihout, Appl. Phys. Lett. 86, 094101 (2005).
5. [5] A. Cerezo, G. D. W. Smith, and P. H. Clifton, Appl. Phys. Lett. 88, 154103 (2006).