Influence of Tip Temperature on Field Evaporation in Atom Probe-Reference-Cited by-同舟云学术

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Influence of Tip Temperature on Field Evaporation in Atom Probe

Published:2011 Issue: Volume:9 Page:375-379
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Mayama N.¹²,Terakawa T.³,Morita M.³,Owari M.³⁴

Affiliation:

1. Chemical Resources Laboratory, Tokyo Institute of Technology, Japan

2. Graduate School of Electrical Engineering and Electronics, Kougakuin University, Japan

3. Institute of Industrial Science, The University of Tokyo, Japan

4. Environmental Science Centerv, The University of Tokyo, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/9/0/9_0_375/_pdf

Reference18 articles.

1. [1] M. K. Miller, Atom Probe Tomography Analysis at Atomic Level (Kluwer Academic/Plemium Publishers, New York, 2000).

2. Field ion image formation

3. Pulsed‐laser atom‐probe field‐ion microscopy

4. Estimation of the tip field enhancement on a field emitter under laser illumination

5. Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Alternate field evaporation by changing laser pulsing and voltage pulsing dynamically for atom probe analysis;Surface and Interface Analysis;2018-09-17

2. Study of the Ionization in a Field Ion Microscope Using Pulsed-Laser;e-Journal of Surface Science and Nanotechnology;2018-05-25

3. Investigation of Sample Deformation in Laser-Assisted Atom Probe Tomography;Journal of Surface Analysis;2018

4. Scanning Atom Probe Analysis Alternately Triggered by Voltage and Laser Pulse;e-Journal of Surface Science and Nanotechnology;2016

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