Time of Flight Analysis of Field-Ionized He in Mixtures with Ne or Ar
Author:
Affiliation:
1. Department of Electrical and Electronic Engineering, School of Engineering, Mie University
2. Center for Ultimate Technology on nano-Electronics, Mie University,
Publisher
Surface Science Society Japan
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology
Link
https://www.jstage.jst.go.jp/article/ejssnt/14/0/14_23/_pdf
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1. Abundance of field-ionized ion species and current stability of ion beam emitted in He-Ne gas mixture;Surface and Interface Analysis;2016-07-27
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