Author:
Livengood Richard H.,Tan Shida,Hallstein Roy,Notte John,McVey Shawn,Faridur Rahman F.H.M.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. The ALIS He ion source and its application to high resolution microscopy
2. Helium ion microscope invasiveness study and novel imaging analysis for semiconductor applications
3. Understanding imaging modes in the helium ion microscope
4. D.S. Pickard, V. Viswanathan, B. Ozyilmaz, J. Thong, M. Sinu, X. Xu, Z.K. Ai, K. Zhang, X. Zhao, T. Venkatesan, in: CPO8 Proceedings, 2010.
5. M. Abramo et al., in: Proceedings of the 20th ISTFA, Los Angeles, CA, November 1994, pp. 439.
Cited by
46 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献