Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy
Author:
Affiliation:
1. Department of Electronic Science and Engineering, Kyoto University, Japan
2. Office of Society-Academia Collaboration for Innovation, Kyoto University, Japan
Publisher
Surface Science Society Japan
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology
Link
http://www.jstage.jst.go.jp/article/ejssnt/9/0/9_0_210/_pdf
Reference29 articles.
1. Room-temperature transistor based on a single carbon nanotube
2. Single- and multi-wall carbon nanotube field-effect transistors
3. [3] M. Burghard, H. Klauk, and K. Kern, Adv. Mater. 21, 2586 (2009), and references therein.
4. Field-Modulated Carrier Transport in Carbon Nanotube Transistors
5. Carbon Nanotubes as Schottky Barrier Transistors
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2. Mean free paths in single-walled carbon nanotubes measured by Kelvin probe force microscopy;Physical Review B;2014-06-30
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