Non-Contact Atomic Force Microscopy and Scanning Tunneling Microscopy of Coexisting Reconstructions on Si(111)-Reference-Cited by-同舟云学术

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Non-Contact Atomic Force Microscopy and Scanning Tunneling Microscopy of Coexisting Reconstructions on Si(111)

Published:2005 Issue: Volume:3 Page:258-262
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Rose Franck¹²,Ishii Takanori¹,Kawai Shigeki¹,Kawakatsu Hideki¹²³

Affiliation:

1. Center for International Research on MicroMechatronics, Institute of Industrial Science, University of Tokyo, Japan

2. Laboratory for Integrated Micro Mechatronic Systems - Centre National de la Recherche Scientifique (UMI 2820), Institute of Industrial Science, University of Tokyo, Japan

3. Japan Science and Technology Agency, Core research for Evolutional Science and Technology, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/3/0/3_0_258/_pdf

Reference24 articles.

1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

2. Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy

3. Experimental aspects of dissipation force microscopy

4. High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope

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