Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions-Reference-Cited by-同舟云学术

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Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions

Published:2002-02 Issue: Volume: Page:
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Author:

Graham Stuart J.,Hall Bronwyn,Harhoff Dietmar,Mowery David

Publisher

National Bureau of Economic Research

Cited by 68 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Data Analytics and Machine Learning Approach to Develop a Technology Roadmap for Next-Generation Logistics Utilizing Underground Systems;Sustainability;2024-08-05

2. Patent Quality: A Critique of the State of the Discussion;IIC - International Review of Intellectual Property and Competition Law;2024-03-18

3. Complementarities and Tensions Between Appropriability and Open Innovation;The Oxford Handbook of Open Innovation;2024-02-22

4. Patent Screening, Innovation, and Welfare;The Review of Economic Studies;2021-10-29

5. Discrimination against foreigners in the U.S. patent system;Journal of International Business Policy;2020-07-15

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