Residual resistivity dipoles, electromigration, and electronic conduction in metallic microstructures
-
Published:1988-01
Issue:1
Volume:32
Page:58-62
-
ISSN:0018-8646
-
Container-title:IBM Journal of Research and Development
-
language:
-
Short-container-title:IBM J. Res. & Dev.
Author:
Sorbello R. S.,Chu C. S.
Subject
General Computer Science
Cited by
39 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献