Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
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Published:1990-03
Issue:2.3
Volume:34
Page:162-172
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ISSN:0018-8646
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Container-title:IBM Journal of Research and Development
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language:
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Short-container-title:IBM J. Res. & Dev.
Subject
General Computer Science
Cited by
33 articles.
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