Observations of “Clean” Surfaces of Si, Ge, and GaAs by Low-Energy Electron Diffraction
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Published:1965-09
Issue:5
Volume:9
Page:375-387
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ISSN:0018-8646
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Container-title:IBM Journal of Research and Development
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language:
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Short-container-title:IBM J. Res. & Dev.
Subject
General Computer Science
Cited by
238 articles.
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