THz Emission Related to Hot Plasmons and Plasma Wave Instability in Field Effect Transistors-Reference-Cited by-同舟云学术

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THz Emission Related to Hot Plasmons and Plasma Wave Instability in Field Effect Transistors

Published:2011-11 Issue:5 Volume:120 Page:924-926
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Dyakonova N.¹²,El Fatimy A.³,Meziani Y.⁴,Coquillat D.¹²,Knap W.¹²,Teppe F.¹²,Buzatu P.¹²,Diforte-Poisson M.A.⁵,Dua C.⁵,Piotrowicz S.⁵,Morvan E.⁵,Delage S.L.⁵

Affiliation:

1. Laboratoire Charles Coulomb UMR 5221, Université Montpellier 2, Montpellier, France

2. CNRS, Laboratoire Charles Coulomb UMR 5221, Montpellier, France

3. Cardiff School of Physics and Astronomy, Cardiff University, Cardiff, United Kingdom

4. Departamento de Física Aplicada, Universidad de Salamanca, Salamanca, Spain

5. III-Vlab, route de Nozay, Marcoussis, France

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Direct nanoscopic observation of plasma waves in the channel of a graphene field-effect transistor;Light: Science & Applications;2020-06-04

2. Terahertz emission from biased AlGaN/GaN high-electron-mobility transistors;Journal of Applied Physics;2019-04-21

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