Comparative study of image contrast in scanning electron microscope and helium ion microscope-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Comparative study of image contrast in scanning electron microscope and helium ion microscope

Published:2017-11-20 Issue:3 Volume:268 Page:313-320
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

O'CONNELL R.¹,CHEN Y.¹²,ZHANG H.¹^ORCID,ZHOU Y.¹³,FOX D.¹,MAGUIRE P.¹,WANG J.J.¹,RODENBURG C.⁴

Affiliation:

1. School of Physics and CRANN & AMBER; Trinity College Dublin; Dublin Republic of Ireland

2. Institute of Microstructure and Property of Advanced Materials; Beijing University of Technology; Beijing China

3. School of Material Science and Engineering; Nanchang University; Nanchang Jiangxi China

4. Department of Materials Science and Engineering; University of Sheffield; Sheffield U.K.

Funder

Science Foundation Ireland

The Royal Society international exchanges grant

EPSRC

Irish Research Council

The Leverhulme Trust for the PicoFib network

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12660/fullpdf

Reference39 articles.

1. Imaging of human colon cancer cells using He-Ion scanning microscopy;Bazou;J. Microsc.,2011

2. Contrast mechanisms and image formation in helium ion microscopy;Bell;Microsc. Microanal.,2009

3. Charging in scanning electron microscopy “from inside and outside;Cazaux;Scanning,2004

4. On some contrast reversals in SEM: application to metal/insulator systems;Cazaux;Ultramicroscopy,2008

5. Contribution of dynamic charging effects into dopant contrast mechanisms in silicon;Chakk;J. Mater. Sci.,2006

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Introduction to non-destructive material characterizations;Non-Destructive Material Characterization Methods;2024

2. Use of the helium ion microscope in small crack fractography;Engineering Failure Analysis;2022-09

3. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope;Reports on Progress in Physics;2021-09-15

4. Ionomer network of catalyst layers for proton exchange membrane fuel cell;Journal of Power Sources;2021-09

5. Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods;Semiconductor Science and Technology;2021-06-29

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3