The benefit of thresholding carbon layers in electron tomographic tilt series by intensity downshifting-Reference-Cited by-同舟云学术

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The benefit of thresholding carbon layers in electron tomographic tilt series by intensity downshifting

Published:2016-11-24 Issue:3 Volume:265 Page:298-306
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

GONTARD LIONEL C.¹,CINTAS JESÚS²,BORKOWSKI RAFAL E. DUNIN³

Affiliation:

1. Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica; Universidad de Cádiz; Puerto Real Spain

2. Servicio de Microscopía Centro de Investigación, Tecnología e Innovación (CITIUS); Universidad de Sevilla; Sevilla Spain

3. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute; Jülich Germany

Funder

Seventh Framework Programme

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12498/fullpdf

Reference43 articles.

1. Geometric reconstruction methods for electron tomography;Alpers;Ultramicroscopy,2013

2. Three-dimensional atomic imaging of colloidal core-shell nanocrystals;Bals;Nano Lett,2011

3. 3D imaging of nanomaterials by discrete tomography;Batenburg;Ultramicroscopy,2009

4. Adaptive thresholding of tomograms by projection distance minimization;Batenburg;Patt. Recogn,2009

5. A ‘no-threshold’ histogram-based image segmentation method;Bonnet;Patt. Recogn,2002

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A single slice approach for simulating two-beam electron diffraction of nanocrystals;Ultramicroscopy;2018-12

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