A single slice approach for simulating two-beam electron diffraction of nanocrystals-Reference-Cited by-同舟云学术

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A single slice approach for simulating two-beam electron diffraction of nanocrystals

Published:2018-12 Issue: Volume:195 Page:171-188
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Gontard Lionel Cervera,Barroso-Bogeat Adrián,Dunin-Borkowski Rafal E.^ORCID,Calvino José Juan^ORCID

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Electron Microscopy of Thin Crystals;Hirsch,1965

2. Introduction to Conventional Transmission Electron Microscopy;De Graef,2003

3. A computer program for many‐beam image simulation of amplitude‐contrast images;Rasmussen;Microscopy Res. Tech.,1991

4. Advanced Computing in Electron Microscopy;Kirkland,2010

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1. Automated, quantitative electron tomography of dislocation morphology combined with deep learning technology;Materials Characterization;2024-01

2. Simulation of transmission electron microscopy images using a generalized single-slice approach: The case of self-assembled quantum dots;Materials Characterization;2020-06

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