Formation and reduction of streak artefacts in electron tomography-Reference-Cited by-同舟云学术

Formation and reduction of streak artefacts in electron tomography

Published:2010-06-16 Issue:1 Volume:239 Page:66-71
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

CAO M.¹,ZHANG H.‐B.¹,LU Y.¹,NISHI R.²,TAKAOKA A.²

Affiliation:

1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi’an Jiaotong University, Xi’an 710049, People's Republic of China

2. Research Centre for Ultrahigh Voltage Electron Microscopy, Osaka University, 7‐1 Mihogaoka, Ibaraki, Osaka 567‐0047, Japan

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.2009.03357.x

Reference23 articles.

1. Nanoparticle shape and configuration analysis by transmission electron tomography

2. Reducing the missing wedge: High-resolution dual axis tomography of inorganic materials

3. 3D-analysis of semiconductor structures by electron tomography

4. Effect of sample structure on reconstruction quality in computed tomography

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