Interstitial Supersaturation And Climb Of Misfit Dislocations In Phosphorus-Diffused Silicon

Author:

Strunk H.,Gösele U.,Kolbesen B. O.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Materials science of defects in GaAs-based semiconductor lasers;Reliability of Semiconductor Lasers and Optoelectronic Devices;2021

2. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01

3. Gettering in Silicon;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27

4. Process‐induced defects in solar cell silicon;Journal of Applied Physics;1985-07

5. Structural Changes During Transient Post-Annealing of Preannealed and Arsenic Implanted Polycrystalline Silicon Films;MRS Proceedings;1985

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