HREM structure characterization of interfaces in semiconducting multi-layers using molecular-dynamics-supported image interpretation
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1995.tb03634.x/fullpdf
Reference20 articles.
1. Coene , W.M.J. Janssen , A.J.E.M. 1991 379
2. Molecular dynamics computer simulations of silica surface structure and adsorption of water molecules
3. Hillebrand , R. 1994 385
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2. Hrem simulations of particles and interfaces refined by molecular dynamics relaxations;Materials Science and Engineering: B;1996-02
3. Molecular dynamics simulations of silicon wafer bonding;Applied Physics A Materials Science & Processing;1996-01
4. HREM simulations of particles and interfaces refined by molecular dynamics relaxations;C,H,N and O in Si and Characterization and Simulation of Materials and Processes;1996
5. TEM/HREM visualization of nm-scale coherent InAs islands (quantum dots) in a GaAs matrix;Physica Status Solidi (a);1995-07-16
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