Energy-filtered Fresnel contrast analysis of Fe/Cu multilayers
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1995.tb03685.x/fullpdf
Reference19 articles.
1. High resolution lattice imaging reveals a ‘phase-transition’ in Cu/NiPd multilayers;Baxter;Nature,1986
2. Quantifying the effects of amorphous layers on image contrast using energy filtered transmission electron microscopy;Boothroyd;Mater. Res. Soc. Proc.,1994
3. The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructures;Boothroyd;Ultramicroscopy,1988
4. The contribution of inelastically scattered electrons to high resolution [110] images of A1As/GaAs heterostructures;Boothroyd;Ultramicroscopy,1989
5. Can the absorption behaviour of superposed layers be fitted simply?;Dobson;Inst. Phys. Conf. Ser.,1991
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