The complementary use of electron backscatter diffraction and ion channelling imaging for the characterization of nanotwins
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.2012.03690.x/fullpdf
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4. Sputtering limits versus signal-to-noise limits in the observation of Sn balls in a Ga+ microscope;Castaldo;J. Vac. Sci. Technol.,2008
5. Characterization of the grain-boundary character and energy distributions of yttria using automated serial sectioning and EBSD in the FIB;Dillon;J. Am. Ceram. Soc.,2009
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