1. Some trends in microscope image processing
2. K. Homma, F. Komura, and T. Furuya (1987 ) An image correction method for vibrated scan of SEM (scanning electron microscope) . Proceedings of the International Workshop on Industrial Applications of Machine Vision and Machine Intelligence. Seiken Symposium (cat. no. 87TH0166-9). IEEE. 1987, pp. 26 -30 . New York, NY.
3. T.C. Isabell (2004 ) Analytical instrumentation facility requirements for nanotechnology . http://www.nanobuildings.com