The principles and practice of the weak-beam method of electron microscopy
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1973.tb03815.x/fullpdf
Reference43 articles.
1. APPLICATIONS AND RECENT DEVELOPMENTS IN TRANSMISSION ELECTRON MICROSCOPY
2. Weak-beam observation of dislocation loops in silicon;Bicknell;Phys. Stat. Sol. (a),1971
3. Weak-beam observations of dislocation loops in silicon;Bicknell;J. Microsc.,1973
4. Interphase interfaces in spinodal alloys;Bouchard;J. Surface Sci.,1972
5. Electron microscope image contrast from dislocation loops;Bullough;Phys. Stat. Sol.,1971
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