Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
11 articles.
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1. Characterization and removal of residual defects in high dose, very low energy BF2+-implanted (001) Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-01
2. Weak-Beam Electron Microscopy;Annual Review of Materials Science;1981-08
3. The scattering of fast electrons by crystals;Reports on Progress in Physics;1979-11-01
4. THE WEAK-BEAM METHOD OF ELECTRON MICROSCOPY;Diffraction and Imaging Techniques in Material Science;1978
5. The orientation dependence of stacking-fault nucleation in silicon;Philosophical Magazine;1975-02