Centroid precision and orientation precision of planar localization microscopy-Reference-Cited by-同舟云学术

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Centroid precision and orientation precision of planar localization microscopy

Published:2016-03-11 Issue:3 Volume:263 Page:238-249
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

MCGRAY C.¹²,COPELAND C.R.³⁴,STAVIS S.M.³,GEIST J.¹

Affiliation:

1. Engineering Physics Division; NIST; Gaithersburg Maryland U.S.A.

2. Modern Microsystems; Silver Spring Maryland U.S.A.

3. Center for Nanoscale Science and Technology; NIST; Gaithersburg Maryland U.S.A.

4. Maryland Nanocenter; University of Maryland; College Park Maryland U.S.A.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12384/fullpdf

Reference44 articles.

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2. Final report: compliant thermo-mechanical MEMS actuators, LDRD #52553;Baker;Sandia National Laboratory,2004

3. Fluorescent image correlation for nanoscale deformation measurements;Berfield;Small,2006

4. Micro- and nanoscale deformation measurement of surface and internal planes via digital image correlation;Berfield;Proc. Soc. Exp. Mech,2007

5. A method for registration of 3-D shapes;Besl;IEEE Trans. Pattern Anal. Mach. Intell,1992

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4. Particle Tracking of a Complex Microsystem in Three Dimensions and Six Degrees of Freedom;2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS);2020-01

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