Improvement of reliability and dielectric breakdown strength of Nb-doped lead zirconate titanate films via microstructure control of seed
Author:
Affiliation:
1. Xaar plc; Cambridge UK
2. Materials Research Institute and Department of Materials Science and Engineering; The Pennsylvania State University; University Park Pennsylvania
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.15940/fullpdf
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4. Giant piezoelectricity on Si for hyperactive MEMS;Baek;Science,2011
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