‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry-Reference-Cited by-同舟云学术

‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry

Published:2019-07-27 Issue:4 Volume:43 Page:531-541
ISSN:1639-4488
Container-title:Geostandards and Geoanalytical Research
language:en
Short-container-title:Geostand Geoanal Res

Author:

Wu Haosheng¹,Böttger Roman²,Couffignal Frédéric³,Gutzmer Jens¹,Krause Joachim¹,Munnik Frans²,Renno Axel D.¹,Hübner René²,Wiedenbeck Michael³,Ziegenrücker René²

Affiliation:

1. Helmholtz Zentrum Dresden‐Rossendorf (HZDR) Helmholtz Institute Freiberg for Resource Technology (HIF) Chemnitzer Str. 40 Freiberg 09599 Germany

2. Helmholtz Zentrum Dresden‐Rossendorf (HZDR) Institute of Ion Beam Physics and Materials Research Bautzner Landstrasse 400 Dresden 01328 Germany

3. Helmholtz Zentrum Potsdam Deutsches GeoForschungsZentrum (GFZ) Telegrafenberg Potsdam14473Germany

Funder

Bundesministerium für Bildung und Forschung

Publisher

Wiley

Subject

Geochemistry and Petrology,Geology,Geochemistry and Petrology,Geology

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/ggr.12282

Reference23 articles.

1. Characterisation of a Natural Quartz Crystal as a Reference Material for Microanalytical Determination of Ti, Al, Li, Fe, Mn, Ga and Ge

2. Calibrating Ti concentrations in quartz for SIMS determinations using NIST silicate glasses and application to the TitaniQ geothermobarometer

3. Ion Implants as Matrix-Appropriate Calibrators for Geochemical Ion Probe Analyses

4. The Guelph PIXE software package IV

5. Ti diffusion in quartz

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