‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry-Reference-Cited by-同舟云学术

‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry

Published:2019-07-27 Issue:4 Volume:43 Page:531-541
ISSN:1639-4488
Container-title:Geostandards and Geoanalytical Research
language:en
Short-container-title:Geostand Geoanal Res

Author:

Wu Haosheng¹,Böttger Roman²,Couffignal Frédéric³,Gutzmer Jens¹,Krause Joachim¹,Munnik Frans²,Renno Axel D.¹,Hübner René²,Wiedenbeck Michael³,Ziegenrücker René²

Affiliation:

1. Helmholtz Zentrum Dresden‐Rossendorf (HZDR) Helmholtz Institute Freiberg for Resource Technology (HIF) Chemnitzer Str. 40 Freiberg 09599 Germany

2. Helmholtz Zentrum Dresden‐Rossendorf (HZDR) Institute of Ion Beam Physics and Materials Research Bautzner Landstrasse 400 Dresden 01328 Germany

3. Helmholtz Zentrum Potsdam Deutsches GeoForschungsZentrum (GFZ) Telegrafenberg Potsdam14473Germany

Funder

Bundesministerium für Bildung und Forschung

Publisher

Wiley

Subject

Geochemistry and Petrology,Geology,Geochemistry and Petrology,Geology

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/ggr.12282

Reference23 articles.

1. Characterisation of a Natural Quartz Crystal as a Reference Material for Microanalytical Determination of Ti, Al, Li, Fe, Mn, Ga and Ge

2. Calibrating Ti concentrations in quartz for SIMS determinations using NIST silicate glasses and application to the TitaniQ geothermobarometer

3. Ion Implants as Matrix-Appropriate Calibrators for Geochemical Ion Probe Analyses

4. The Guelph PIXE software package IV

5. Ti diffusion in quartz

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion implantation effects on the characteristics of β-Ga2O3 epilayers grown on sapphire by MOCVD;Ceramics International;2022-12

2. Super-SIMS at DREAMS: Status of a unique and complex endeavour;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-12

3. Ni-Au layers on sapphire prepared by direct current magnetron sputtering;Radiation Effects and Defects in Solids;2022-10-20

4. High-Fluence Multi-Energy Ion Irradiation for Testing of Materials;Materials;2022-09-16

5. Atomic spectrometry update – a review of advances in environmental analysis;Journal of Analytical Atomic Spectrometry;2021