Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers-Reference-Cited by-同舟云学术

Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers

Published:2017-10-03 Issue:3 Volume:268 Page:288-297
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

NORRIS D.J.¹,MYRONOV M.²,LEADLEY D.R.²,WALTHER T.¹^ORCID

Affiliation:

1. Kroto Centre for High-Resolution Imaging and Analysis; Department of Electronic and Electrical Engineering; University of Sheffield; Sheffield U.K.

2. Department of Physics; University of Warwick; Coventry U.K.

Funder

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12654/fullpdf

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