Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures’ optical properties
Author:
Affiliation:
1. Laboratoire de Recherche sur les Nanosciences (LRN), EA4682; Université de Reims Champagne-Ardenne; Reims France
Funder
DRRT Champagne Ardenne
Federación Española de Enfermedades Raras
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12407/fullpdf
Reference36 articles.
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3. Strong deviations from Fowler-Nordheim behavior for field emission from individual SiC nanowires due to restricted bulk carrier generation;Choueib;Phys. Rev. B,2009
4. Near-field detection cathodoluminescence investigations;Cramer;J. Phys. D: Appl. Phys,1998
5. Scanning near-field cathodoluminescence investigations;Cramer;Scanning,1998
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Direct manipulation of metallic nanosheets by shear force microscopy;Journal of Microscopy;2018-05-15
2. Cathodoluminescence for the 21st century: Learning more from light;Applied Physics Reviews;2017-09
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