Author:
MOSSELVELD F.,MAKAROV V. V.,LUNDQUIST T. R.,GRIFFIS D. P.,RUSSELL P. E.
Subject
Histology,Pathology and Forensic Medicine
Cited by
5 articles.
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2. Energetic Cs+ion interaction with common microelectronic materials—An investigation of a future FIB candidate source;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-11
3. Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2012-07
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