Growth Behavior and Electrical Properties of a (Na0.5K0.5)NbO3Thin Film Deposited on a Pt/Ti/SiO2/Si Substrate Using RFMagnetron Sputtering-Reference-Cited by-同舟云学术

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Growth Behavior and Electrical Properties of a (Na0.5K0.5)NbO3Thin Film Deposited on a Pt/Ti/SiO2/Si Substrate Using RFMagnetron Sputtering

Published:2011-05-12 Issue:7 Volume:94 Page:1970-1973
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:

Author:

Kang Lee-Seung,Kim Bo-Yun,Seo In-Tae,Seong Tae-Geun,Kim Jin-Seong,Sun Jong-Woo,Paik Dong-Soo,Hwang Inrok,Park Bae Ho,Nahm Sahn

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2011.04574.x/fullpdf

Reference19 articles.

1. Lead-Free Piezoceramics;Saito;Nature,2004

2. Perovskite (Na0.5K0.5)1−x(LiSb)xNb1−xO3 Lead-Free Piezoceramics;Zang;Appl. Phys. Lett.,2006

3. Piezoelectric Properties of Li- and Ta-Modified (K0.5Na0.5)NbO3 Ceramics;Hollenstein;Appl. Phys. Lett.,2005

4. Microstructure and Piezoelectric Properties of 0.95(Na0.5K0.5)NbO3-0.05BaTiO3 Ceramics;Park;Appl. Phys. Lett.,2006

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3. Investigation of annealing effects on structural, morphological, optical, chemical, and luminescent properties of (K,Na)NbO3 thin films;Physica B: Condensed Matter;2023-07

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