Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications-Reference-Cited by-同舟云学术

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications

Author:

WINKELMANN A.¹^ORCID,NOLZE G.²,VESPUCCI S.³,NARESH-KUMAR G.³,TRAGER-COWAN C.³,VILALTA-CLEMENTE A.⁴,WILKINSON A.J.⁴,VOS M.⁵

Affiliation:

1. Bruker Nano GmbH; Berlin Germany

2. BAM; Federal Institute for Materials Research and Testing; Berlin Germany

3. Department of Physics, SUPA; University of Strathclyde; Glasgow UK

4. Department of Materials; University of Oxford; Oxford UK

5. Electronic Materials Engineering Department, Research School of Physics and Engineering; The Australian National University; Canberra Australia

Funder

Engineering and Physical Sciences Research Council

Carnegie Trust Research Incentive

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

Reference58 articles.

1. High-angle Kikuchi patterns;Alam;Proc. R. Soc. A,1954

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