An electrical resistance degradation model for thin film under fatigue loading
Author:
Affiliation:
1. Department of Engineering Mechanics, Jiangsu Key Laboratory of Engineering Mechanics Southeast University Nanjing 210096 China
2. Department of Electrical and Computer Engineering Northeastern University Boston MA 02115 USA
Funder
Graduate Research and Innovation Projects of Jiangsu Province
China Scholarship Council
Publisher
Wiley
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1111/ffe.13278
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