Eliminating the high false‐positive rate in defect prediction through <scp>BayesNet</scp> with adjustable weight-Reference-Cited by-同舟云学术

Eliminating the high false‐positive rate in defect prediction through BayesNet with adjustable weight

Published:2022-03-04 Issue:6 Volume:39 Page:
ISSN:0266-4720
Container-title:Expert Systems
language:en
Short-container-title:Expert Systems

Author:

Zhao Yanyang¹²^ORCID,Wang Yawen¹²,Zhang Dalin³,Gong Yunzhan¹

Affiliation:

1. State Key Laboratory of Networking and Switching Technology Beijing University of Posts and Telecommunications Beijing China

2. Guangxi Key Laboratory of Cryptography and Information Security Guilin China

3. School of Software Engineering Beijing Jiaotong University Beijing China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Artificial Intelligence,Computational Theory and Mathematics,Theoretical Computer Science,Control and Systems Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/exsy.12977

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