Colour‐patterned fabric‐defect detection using unsupervised and memorial defect‐free features-Reference-Cited by-同舟云学术

Colour‐patterned fabric‐defect detection using unsupervised and memorial defect‐free features

Published:2022-07-15 Issue:6 Volume:138 Page:602-620
ISSN:1472-3581
Container-title:Coloration Technology
language:en
Short-container-title:Coloration Technology

Author:

Zhang Hongwei¹²,Zhang Weiwei²,Wang Yang³,Lu Shuai⁴,Yao Le¹,Chen Xia⁵

Affiliation:

1. State Key Laboratory of Industrial Control Technology, Institute of Industrial Process Control, College of Control Science and Engineering Zhejiang University Hangzhou China

2. School of Electronics and Information Xi'an Polytechnic University Xi'an China

3. School of Electric Engineering Shanghai Dianji University Shanghai China

4. Institute of Engineering Medicine Beijing Institute of Technology Beijing China

5. School of Clothing Department Xi'an Academy of Fine Arts Xi'an China

Publisher

Wiley

Subject

Materials Science (miscellaneous),General Chemical Engineering,Chemistry (miscellaneous)

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/cote.12624

Reference34 articles.

1. Computer-Vision-Based Fabric Defect Detection: A Survey

2. Automated fabric defect detection—A review

3. Robust low-rank decomposition of multi-channel feature matrices for fabric defect detection

4. Deep learning

5. Generative adversarial networks[J];Goodfellow IJ;Advances in Neural Information Processing Systems,2014

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